B. Rouzeyre: search on Z-Library

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1

Novel transient-fault detection circuit featuring enhanced bulk built-in current sensor with low-power sleep-mode

R. Possamai Bastos, F. Sill Torres, G. Di Natale, M. Flottes, B. Rouzeyre

Journal:

Microelectronics Reliability

Year:

2012

Language:

english

File:

PDF, 893 KB

english, 2012

2

[IEEE Design, Automation and Test in Europe - Munich, Germany (07-11 March 2005)] Design, Automation and Test in Europe - Mutation Sampling Technique for the Generation of Structural Test Data

Scholive, M., Beroulle, V., Robach, C., Flottes, M.L., Rouzeyre, B.

Year:

2005

Language:

english

File:

PDF, 93 KB

english, 2005

3

Preventing Scan Attacks on Secure Circuits Through Scan Chain Encryption

Da Silva, Mathieu, Flottes, Marie-Lise, Di Natale, Giorgio, Rouzeyre, Bruno

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2018

Language:

english

File:

PDF, 3.21 MB

english, 2018

4

A Survey on Security Threats and Countermeasures in IEEE Test Standards

Valea, Emanuele, Da Silva, Mathieu, Di Natale, Giorgio, Flottes, Marie-Lise, Rouzeyre, Bruno

Journal:

IEEE Design and Test

Year:

2019

File:

PDF, 1.04 MB

2019

5

[IEEE 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS) - Napoli, Italy (2020.7.13-2020.7.15)] 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS) - Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs

Azais, F., Bernard, S., Comte, M., Deveautour, B., Dupuis, S., Badawi, H. El, Flottes, M.-L., Girard, P., Kerzerho, V., Latorre, L., Lefevre, F., Rouzeyre, B., Valea, E., Vayssadel, T., Virazel, A.

Year:

2020

File:

PDF, 536 KB

2020

6

Thermal Transformation of the Electron-Irradiation-Induced Defect H4 in p Type InP

Bretagnon, Th., Bastide, G., Rouzeyre, M.

Journal:

Materials Science Forum

Year:

1986

File:

PDF, 350 KB

1986

7

)→

Bretagnon, T., Bastide, G., Rouzeyre, M.

Journal:

Physical Review B

Year:

1990

Language:

english

File:

PDF, 516 KB

english, 1990

8

[IEEE 2019 IEEE 4th International Verification and Security Workshop (IVSW) - Rhodes Island, Greece (2019.7.1-2019.7.3)] 2019 IEEE 4th International Verification and Security Workshop (IVSW) - A Comprehensive Approach to a Trusted Test Infrastructure

Merandat, Marc, Reynaud, Vincent, Valea, Emanuele, Quevremont, Jerome, Valette, Nicolas, Maistri, Paolo, Leveugle, Regis, Flottes, Marie-Lise, Dupuis, Sophie, Rouzeyre, Bruno, Di Natale, Giorgio

Year:

2019

File:

PDF, 664 KB

2019

9

[IEEE 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS) - Napoli, Italy (2020.7.13-2020.7.15)] 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS) - A Secure Scan Controller for Protecting Logic Locking

Nguyen, Quang-Linh, Valea, Emanuele, Flottes, Marie-Lise, Dupuis, Sophie, Rouzeyre, Bruno

Year:

2020

File:

PDF, 346 KB

2020

10

Assessing body built-in current sensors for detection of multiple transient faults

Viera, R.A.C., Dutertre, J.-M., Flottes, M.-L., Potin, O., Natale, G. Di, Rouzeyre, B., Bastos, R. Possamai

Journal:

Microelectronics Reliability

Year:

2018

Language:

english

File:

PDF, 1.96 MB

english, 2018

11

[IEEE 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - Chania (2013.7.8-2013.7.10)] 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - A smart test controller for scan chains in secure circuits

Da Rolt, Jean, Di Natale, Giorgio, Flottes, Marie-Lise, Rouzeyre, Bruno

Year:

2013

Language:

english

File:

PDF, 133 KB

english, 2013

12

[IEEE 2018 IEEE 3rd International Verification and Security Workshop (IVSW) - Costa Brava, Spain (2018.7.2-2018.7.4)] 2018 IEEE 3rd International Verification and Security Workshop (IVSW) - A New Secure Stream Cipher for Scan Chain Encryption

Da Silva, Mathieu, Valea, Emanuele, Flottes, Marie-Lise, Dupuis, Sophie, Di Natale, Giorgio, Rouzeyre, Bruno

Year:

2018

Language:

english

File:

PDF, 232 KB

english, 2018

13

in p -type InP: A charge-controlled bistable model

Bretagnon, T., Bastide, G., Rouzeyre, M.

Journal:

Physical Review B

Year:

1989

Language:

english

File:

PDF, 321 KB

english, 1989

14

[IEEE Systems (DDECS) - Cottbus, Germany (2011.04.13-2011.04.15)] 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems - Power consumption traces realignment to improve differential power analysis

Natale, G. Di, Flottes, M.L., Rouzeyre, B., Valka, M., Real, D.

Year:

2011

Language:

english

File:

PDF, 701 KB

english, 2011

15

[Presses Polytech. Univ. Romandes ISCAS 2000 Geneva. 2000 IEEE International Symposium on Circuits and Systems. Emerging Technologies for the 21st Century. Proceedings - Geneva, Switzerland (28-31 May 2000)] 2000 IEEE International Symposium on Circuits and Systems. Emerging Technologies for the 21st Century. Proceedings (IEEE Cat No.00CH36353) - A controller resynthesis based method for improving datapath testability

Flottes, M.L., Rouzeyre, B., Volpe, L.

Year:

2000

Language:

english

File:

PDF, 293 KB

english, 2000

16

Sensitivity tuning of a bulk built-in current sensor for optimal transient-fault detection

Dutertre, J.M., Possamai Bastos, R., Potin, O., Flottes, M.L., Rouzeyre, B., Di Natale, G.

Journal:

Microelectronics Reliability

Year:

2013

Language:

english

File:

PDF, 1.38 MB

english, 2013

17

[IEEE 2013 9th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME) - Villach, Austria (2013.06.24-2013.06.27)] Proceedings of the 2013 9th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME) - A JTAG based 3D DfT architecture using automatic die detection

Fkih, Yassine, Vivet, Pascal, Rouzeyre, Bruno, Flottes, Marie-lise, Di Natale, Giorgio

Year:

2013

Language:

english

File:

PDF, 238 KB

english, 2013

18

[IEEE 2017 22nd IEEE European Test Symposium (ETS) - Limassol, Cyprus (2017.5.22-2017.5.26)] 2017 22nd IEEE European Test Symposium (ETS) - Scan chain encryption for the test, diagnosis and debug of secure circuits

Da Silva, Mathieu, Flottes, Marie-lise, Di Natale, Giorgio, Rouzeyre, Bruno, Prinetto, Paolo, Restifo, Marco

Year:

2017

Language:

english

File:

PDF, 647 KB

english, 2017

19

Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS

Dutertre, J.M., Possamai Bastos, R., Potin, O., Flottes, M.L., Rouzeyre, B., Di Natale, G., Sarafianos, A.

Journal:

Microelectronics Reliability

Year:

2014

Language:

english

File:

PDF, 768 KB

english, 2014

20

Scan attacks on side-channel and fault attack resistant public-key implementations

Jean Da Rolt, Amitabh Das, Santosh Ghosh, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre, Ingrid Verbauwhede

Journal:

Journal of Cryptographic Engineering

Year:

2012

Language:

english

File:

PDF, 663 KB

english, 2012

21

[IEEE Comput. Soc. Press [1992] The European Conference on Design Automation - Brussels, Belgium (16-19 March 1992)] [1992] Proceedings The European Conference on Design Automation - A structural optimization method for symbolic FSMs

Rouzeyre, B., Sagnes, G., Tarroux, G.

Year:

1992

Language:

english

File:

PDF, 391 KB

english, 1992

22

[IEEE 2015 20th IEEE European Test Symposium (ETS) - Cluj-Napoca, Romania (2015.5.25-2015.5.29)] 2015 20th IEEE European Test Symposium (ETS) - Session-less based thermal-aware 3D-SIC test scheduling

Flottes, Marie-Lise, Azevedo, Joao, Di Natale, Giorgio, Rouzeyre, Bruno

Year:

2015

Language:

english

File:

PDF, 167 KB

english, 2015

23

Fonction mémoire acoustique dans les semiconducteurs piézoélectriques. Interprétation acoustoélectrique

Rouzeyre, M., Maerfeld, C.

Journal:

Journal de Physique

Year:

1976

Language:

french

File:

PDF, 1.10 MB

french, 1976

24

Migration des ions dans l'oxyde de structures MIS (AlAl2O3Si)

B. Pistoulet, M. Rouzeyre, D. Auvergne

Journal:

Solid-State Electronics

Year:

1969

File:

PDF, 581 KB

1969

25

Physical properties of the deep X electron trap responsible for long time persistent photocapacitance in CdS

Malik Housin, Michel Fialin, Georges Sagnes, Gérard Bastide, M. Rouzeyre

Journal:

Year:

1983

Language:

english

File:

PDF, 269 KB

english, 1983

26

Attenuation of dispersive Rayleigh waves on quartz

Cambon, G., Rouzeyre, M.

Journal:

Electronics Letters

Year:

1970

Language:

english

File:

PDF, 351 KB

english, 1970

27

Interface studies and electrical properties of plasma sulfide layers on n-type InP

Klopfenstein, P., Bastide, G., Rouzeyre, M., Gendry, M., Durand, J.

Journal:

Journal of Applied Physics

Year:

1988

Language:

english

File:

PDF, 1.25 MB

english, 1988

28

[IEEE European Test Symposium (ETS'05) - Tallinn, Estonia (22-25 May 2005)] European Test Symposium (ETS'05) - Test Control for Secure Scan Designs

Hely, D., Bancel, F., Flottes, M., Rouzeyre, B.

Year:

2005

Language:

english

File:

PDF, 117 KB

english, 2005

29

[IEEE 2009 10th Latin American Test Workshop - Rio de Janeiro, Brazil (2009.03.2-2009.03.5)] 2009 10th Latin American Test Workshop - Execution time reduction of Differential Power Analysis experiments

Di Natale, Giorgio, Flottes, Marie-Lise, Rouzeyre, Bruno

Year:

2009

Language:

english

File:

PDF, 237 KB

english, 2009

30

[IEEE 2015 European Conference on Circuit Theory and Design (ECCTD) - Trondheim, Norway (2015.8.24-2015.8.26)] 2015 European Conference on Circuit Theory and Design (ECCTD) - Hardware Trojan prevention using layout-level design approach

Ba, Papa-Sidy, Palanichamy, Manikandan, Dupuis, Sophie, Flottes, Marie-Lise, Di Natale, Giorgio, Rouzeyre, Bruno

Year:

2015

Language:

english

File:

PDF, 519 KB

english, 2015

31

Thwarting Scan-Based Attacks on Secure-ICs With On-Chip Comparison

Rolt, Jean Da, Di Natale, Giorgio, Flottes, Marie-Lise, Rouzeyre, Bruno

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2014

Language:

english

File:

PDF, 608 KB

english, 2014

32

[IEEE 2014 9th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - Santorini, Greece (2014.5.6-2014.5.8)] 2014 9th IEEE International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - Layout-aware laser fault injection simulation and modeling: From physical level to gate level

Lu, Feng, Natale, Giorgio Di, Flottes, Marie-Lise, Rouzeyre, Bruno, Hubert, Guillaume

Year:

2014

Language:

english

File:

PDF, 888 KB

english, 2014

33

Lattice coupling strength of electron-induced-irradiated defects in InP

G. Bastide, D. Bayaa, M. Rouzeyre

Journal:

Solid State Communications

Year:

1986

Language:

english

File:

PDF, 394 KB

english, 1986

34

[IEEE 2013 Design and Test Symposium (IDT) - Marrakesh, Morocco (2013.12.16-2013.12.18)] 2013 8th IEEE Design and Test Symposium - A BIST method for TSVs pre-bond test

Zimouche, Hakim, Di Natale, Giorgio, Flottes, Marie-lise, Rouzeyre, Bruno

Year:

2013

Language:

english

File:

PDF, 1.54 MB

english, 2013

35

Graded-composition semiconductors as tunable narrow-band optical filters

Laurenti, J. P., Rustagi, K., Rouzeyre, M., Rufer, H., Ruppel, W.

Journal:

Journal of Applied Physics

Year:

1977

Language:

english

File:

PDF, 399 KB

english, 1977

36

Effect of a deep electron trap with strong lattice relaxation and of interface states on the C-2=ƒ(V) characteristics of Au-CdS Schottky diodes

M. Housin, M. Fialin, G. Bastide, G. Sagnes, M. Rouzeyre

Journal:

Journal of Crystal Growth

Year:

1982

Language:

english

File:

PDF, 435 KB

english, 1982

37

Localized defects in p-CdTe:Cu doped by copper incorporation during Bridgman growth

J.P. Laurenti, G. Bastide, M. Rouzeyre, R. Triboulet

Journal:

Solid State Communications

Year:

1988

Language:

english

File:

PDF, 366 KB

english, 1988

38

[IEEE 1972 Ultrasonics Symposium - (1970.10.4-1970.10.7)] 1972 Ultrasonics Symposium - Non Linear Acoustoelectric Interaction of Shear Surface Waves in CdS

Sagnes, G., Rouzeyre, M.

Year:

1972

Language:

english

File:

PDF, 160 KB

english, 1972

39

[IEEE Comput. Soc. Press Euro ASIC '91 - Paris, France (1991.05.27-1991.05.31)] Euro ASIC '91 - A new method for the minimization of memory area in high level synthesis

Rouzeyre, B., Sagnes, G.

Year:

1991

File:

PDF, 459 KB

1991

40

[IEEE Comput. Soc. Press the European Design and Test Conference. ED&TC 1995 - Paris, France (6-9 March 1995)] Proceedings the European Design and Test Conference. ED&TC 1995 - High-level synthesis for easy testability

Flottes, M.L., Hammad, D., Rouzeyre, B.

Year:

1995

Language:

english

File:

PDF, 899 KB

english, 1995

41

Acoustic microscopy with noncoherent source

Attal, J., Truong-Quang, N., Cambon, G., Saurel, J.M., Rouzeyre, M.

Journal:

Electronics Letters

Year:

1981

Language:

english

File:

PDF, 423 KB

english, 1981

42

[IEEE 2016 1st IEEE International Verification and Security Workshop (IVSW) - Sant Feliu de Guixols, Spain (2016.7.4-2016.7.6)] 2016 1st IEEE International Verification and Security Workshop (IVSW) - Using outliers to detect stealthy hardware trojan triggering?

Ba, Papa-Sidy, Dupuis, Sophie, Flottes, Marie-Lise, Di Natale, Giorgio, Rouzeyre, Bruno

Year:

2016

Language:

english

File:

PDF, 195 KB

english, 2016

43

Niveaux profonds dans les matériaux à haute résistivité : Si et Cds

Merlet, C., Bastide, G., Sagnes, G., Rouzeyre, M.

Journal:

Revue de Physique Appliquée

Year:

1978

Language:

french

File:

PDF, 638 KB

french, 1978

44

[IEEE Comput. Soc. Press European Design and Test Conference. ED & TC 97 - Paris, France (17-20 March 1997)] Proceedings European Design and Test Conference. ED & TC 97 - Analyzing testability from behavioral to RT level

Flottes, M.L., Pires, R., Rouzeyre, B.

Year:

1997

Language:

english

File:

PDF, 700 KB

english, 1997

45

[IEEE 2010 Fifth IEEE International Symposium on Electronic Design, Test & Applications - Ho Chi Minh City, Vietnam (2010.01.13-2010.01.15)] 2010 Fifth IEEE International Symposium on Electronic Design, Test & Applications - Evaluation of Resistance to Differential Power Analysis: Execution Time Optimizations for Designers

Di Natale, G., Flottes, M.-L., Rouzeyre, B.

Year:

2010

Language:

english

File:

PDF, 698 KB

english, 2010

46

[IEEE Comput. Soc Design, Automation and Test in Europe - Paris, France (23-26 Feb. 1998)] Proceedings Design, Automation and Test in Europe - Scanning datapaths: a fast and effective partial scan selection technique

Flottes, M.L., Pires, R., Rouzeyre, B., Volpe, L.

Year:

1998

Language:

english

File:

PDF, 20 KB

english, 1998

47

Preparation electrical properties and interface studies of plasma nitride layers on n-type InP

Astito, A., Foucaran, A., Bastide, G., Rouzeyre, M., Leclercq, J. L., Durand, J.

Journal:

Journal of Applied Physics

Year:

1991

Language:

english

File:

PDF, 794 KB

english, 1991

48

[IEEE 2015 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) - Montpellier, France (2015.7.8-2015.7.10)] 2015 IEEE Computer Society Annual Symposium on VLSI - Figure of Merits of 28nm Si Technologies for Implementing Laser Attack Resistant Security Dedicated Circuits

Castro, S. de, Natale, G. Di, Flottes, M.-L., Rouzeyre, B., Dutertre, J.-M.

Year:

2015

Language:

english

File:

PDF, 1.12 MB

english, 2015

49

Frontside Versus Backside Laser Injection

Castro, Stephan De, Dutertre, Jean-Max, Rouzeyre, Bruno, Natale, Giorgio Di, Flottes, Marie-Lise

Journal:

ACM Journal on Emerging Technologies in Computing Systems

Year:

2016

Language:

english

File:

PDF, 814 KB

english, 2016

50

[IEEE Comput. Soc IEEE International High Level Design Validation and Test Workshop (HLDVT'02) - Cannes, France (27-29 Oct. 2002)] Seventh IEEE International High-Level Design Validation and Test Workshop, 2002. - A simple and effective compression scheme for test pins reduction

Flottes, M.-L., Poirier, R., Rouzeyre, B.

Year:

2002

Language:

english

File:

PDF, 289 KB

english, 2002

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